XPS,X-ray photoelectron spectroscopy
1)X-ray photoelectron spectroscopyXPS
1.Examination ofX-ray photoelectron spectroscopy(XPS) demonstrated that the peak of Al(2p) on polyacetal grafted Al_2O_3 surfaces(almost) disappeared, while that of O(1s) increased.X射线光电子能谱(XPS)的分析结果表明,经过聚缩醛接枝改性的纳米Al2O3的Al(2p)峰几乎消失,O(1s)峰也相应降低,与之相对应的是C(1s)峰有了明显的增长,对C(1s)峰精细扫描及分峰拟合表明,纳米Al2O3表面碳元素中有61。
2.The working principles of several advanced surface analysis instrument includingX-ray photoelectron spectroscopy(XPS),atomic force microscopy(AFM) and time of flight secondary ion mass spectroscopy(ToF-SIMS) are introduced, their successful application in fiber surface analysis recent years is reviewed.介绍了先进的表面分析仪器化学分析电子能谱(XPS)、原子力显微镜(AFM)、含飞行时间分析器的二次离子质谱仪(ToF-SIMS)的工作原理,回顾了近年来它们在植物纤维表面分析中的成功应用,综合利用XPS、AFM及ToF-SIMS方法,可分析和解决制浆造纸过程中的现象和问题。
3.The surface morphology, composition and structure character of the Fe-N-O thin films were studied by scanning electron microscopy (SEM),X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM).通过扫描电子显微镜(SEM)、光电子能谱(XPS)和透射电子显微镜(TEM)等先进实验分析手段对二极溅射沉积Fe N O薄膜的形貌与结构进行了分析。
英文短句/例句
1.Analysis of masson pine CTMP with XPS and AFM马尾松CTMP的XPS和AFM分析
2.Influence factors of adhesive property between mortar and XPS board in external thermal insulation composite systems based on XPS浅析XPS板薄抹灰保温体系中砂浆与XPS板粘结性能的影响因素
3.XPS and UV-PL Studies on Tin Doped in Float Glass;浮法玻璃表面渗锡的XPS与UV-PL研究
4.Set up a Cathode Research Device Connecting with XPS/AES;建立与XPS/AES相连的阴极研究系统
5.Study on Defects of SiO_2/4H-SiC(0001) Interface by XPS;SiO_2/4H-SiC（0001）界面缺陷的XPS研究
6.Study of Application of XPS Board in Frozen Subgrade WorksXPS板在冻土路基工程中的应用研究
7.Study on the Silicides in Cuticle of Wheat Straw Stem by Means of XPS(Ⅰ)麦秆皮层硅化物的XPS研究(Ⅰ)
8.Study on the Silicides in Cuticle of Wheat Straw Stem by Means of XPS(Ⅱ)麦秆皮层硅化物的XPS研究(Ⅱ)
9.X-ray Photoelectron Spectroscopy and Spectroscopic Ellipsometry Study of the Thermal Oxide on Gallium NitrideGaN基热氧化物的XPS和椭偏光谱研究
10.Study on Silicides in Cuticle of Rice Straw by Means of XPS(Ⅰ)稻草皮层硅化物的XPS研究(Ⅰ)
11.Study on Silicides in Cuticle of Rice Straw by Means of XPS(Ⅱ)稻草皮层硅化物的XPS研究(Ⅱ)
12.Research on Surface Corrosion Layer of CuAlSn AlloyCuAlSn合金表面腐蚀层的XPS研究
13.FTIR and XPS Spectroscopic Studies of Photodegradation of Moso Bamboo(Phyllostachys Pubescens Mazel)毛竹材表面光化降解的FTIR和XPS分析
14.Method Comparison of Artificial Frontal Drill and XPS Frontal Drill手摇额钻与XPS额钻使用方法的比较
15.On the Preparation of Thermal Infrared Detecting VO_2 Film and XPS Analysis热红外探测VO_2薄膜的制备与XPS分析
16.XPS Analysis of Cellulose Treated with Two Ionic Liquids两种离子液体处理纤维素的XPS分析
17.XPS Study on Process of Aluminum Deposition on Uranium金属铀表面铝薄膜生长行为的XPS研究
18.Investigation of bonded InP/GaAs interface by XPSInP/GaAs异质键合界面的XPS研究
相关短句/例句
X ray photoelectron spectroscopy (XPS)XPS法
3)XPS spectraXPS谱
1.The XRD spectra andXPS spectra were measured for Sr doped La 1- x Sr x CoO 3 materials with perovskite structure prepared by the solid state reaction method.测试了该材料的XRD和XPS谱 ,研究了不同热处理工艺对La1 -xSrxCoO3材料平均晶粒度的影响 ,研究了不同Sr掺杂量的La1 -xSrxCoO3阴极材料表面的化学状态。
2.XPS spectra are obtained for the bleached and coloured statos in Ni2p3/2 and O1s regions.着色没有自发过程，获取了着消色状态Ni2p3/2和O1s的XPS谱，表明在着色态镍被氧化，消色态镍被还原，相应地氧的化学环境发生改变。
4)XPS boardXPS板
1.Performance analysis and application research onXPS boardXPS板的性能分析及应用研究
2.In this article,authors analyse all kinds of reasons which influence the bending resistance ability of XPS insulating boards,and show the actual experimental method to test bending resistance ability ofXPS boards.分析了影响XPS保湿板弯曲性能的各种因素,确定了XPS板弯曲性能的具体试验方法。
3.But it must be noted thatXPS board has its own weaknesses, such as high shrinkage,easily warping,inferior adhesive property caused by smooth surface,and peeling off induced by deformation.目前挤塑式聚苯乙烯保温板(简称XPS)应用于外墙外保温中较为普遍,但由于XPS板的收缩大、易翘曲;表皮非常光滑致密,与砂浆的粘结性差,容易变形脱落从而引发安全问题,因而提高砂浆与XPS板之间粘结强度非常关键。
5)XPS spectrumXPS谱
1.The analysis ofXPS spectrum of thin films formed by Cu cluster beam deposited onto Si substrate;用能量3keV流强为4～6μA/cm2Ar+束,预溅射处理样品表面后,用XPS分析,常规磁控溅射室温下得到的Cu/P-Si(111)样品和铜团簇束沉积,偏压分别为0,1,3,5,10kV的样品XPS谱和块状Cu标样谱基本一样,Cu2P1、Cu2P3、CuLMM特征峰位没有移动,反映不出原子结合能差异。
6)XPS characterizationXPS表征
延伸阅读
XPS分子式：CAS号：性质：也称化学分析用电子能谱（ESCA），即以X射线为激发源激发原子内层电子的光电子能谱。该方法可以通过测定1s电子的结合能来鉴定样品的化学元素。此外，通过考察光电子峰的位移（称为化学位移）可以研究化合物的化学键和电荷分布，探讨固体表面的结构问题。
